Author: Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Series: Reliability of Multiphysical Systems Set, 10
Publisher: Wiley-ISTE
Year: 2022
Edition:
Language: English
ISSN:
Applications and Metrology at Nanometer Scale 2: Measurement Systems, Quantum Engineering and RBDO Method (PDF/EPUB Version)
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